Abstract Systems and methods for improved interferometric imaging are presented. One
embodiment is a partial field frequency-domain interferometric imaging system in which a
light beam is scanned in two directions across a sample and the light scattered from the
object is collected using a spatially resolved detector. The light beam could illuminate a spot,
a line or a two-dimensional area on the sample. Additional embodiments with applicability to
partial field as well as other types of interferometric systems are also presented.