Halide remixing under device operation imparts stability on mixed‐cation mixed‐halide perovskite solar cells

E Ruggeri, M Anaya, K Gałkowski… - Advanced …, 2022 - Wiley Online Library
Advanced Materials, 2022Wiley Online Library
Mixed‐halide mixed‐cation hybrid perovskites are among the most promising perovskite
compositions for application in a variety of optoelectronic devices due to their high
performance, low cost, and bandgap‐tuning capabilities. Instability pathways such as those
driven by ionic migration, however, continue to hinder their further progress. Here, an
operando variable‐pitch synchrotron grazing‐incidence wide‐angle X‐ray scattering
technique is used to track the surface and bulk structural changes in mixed‐halide mixed …
Mixed‐halide mixed‐cation hybrid perovskites are among the most promising perovskite compositions for application in a variety of optoelectronic devices due to their high performance, low cost, and bandgap‐tuning capabilities. Instability pathways such as those driven by ionic migration, however, continue to hinder their further progress. Here, an operando variable‐pitch synchrotron grazing‐incidence wide‐angle X‐ray scattering technique is used to track the surface and bulk structural changes in mixed‐halide mixed‐cation perovskite solar cells under continuous load and illumination. By monitoring the evolution of the material structure, it is demonstrated that halide remixing along the electric field and illumination direction during operation hinders phase segregation and limits device instability. Correlating the evolution with directionality‐ and depth‐dependent analyses, it is proposed that this halide remixing is induced by an electrostrictive effect acting along the substrate out‐of‐plane direction. However, this stabilizing effect is overwhelmed by competing halide demixing processes in devices exposed to humid air or with poorer starting performance. The findings shed new light on understanding halide de‐ and re‐mixing competitions and their impact on device longevity. These operando techniques allow real‐time tracking of the structural evolution in full optoelectronic devices and unveil otherwise inaccessible insights into rapid structural evolution under external stress conditions.
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