Hot-carrier effects in MOS devices
E Takeda, CY Yang, CYW Yang, A Miura-Hamada - 1995 - books.google.com
… necessary for studies of hotcarrier effects. This chapter begins with a short historical
narrative on MOS devices and proceeds with a complete treatment of the MOS diode. The …
narrative on MOS devices and proceeds with a complete treatment of the MOS diode. The …
Comparison of NMOS and PMOS hot carrier effects from 300 to 77 K
M Song, KP MacWilliams… - … on Electron Devices, 1997 - ieeexplore.ieee.org
… In this work, hot carrier effects in both p- and nchannel MOS devices … of hot carrier degradation
behavior over wide temperature range is presented. A thorough investigation of hot carrier …
behavior over wide temperature range is presented. A thorough investigation of hot carrier …
Reliability effects on MOS transistors due to hot-carrier injection
KL Chen, SA Saller, IA Groves… - … on Electron Devices, 1985 - ieeexplore.ieee.org
… It has been reported that the Hot-carrier effect also depends on other process parameters …
Thus evaluating other processes as to their susceptibility to hot-carrier effects, will allow the …
Thus evaluating other processes as to their susceptibility to hot-carrier effects, will allow the …
Hot-carrier effects in scaled MOS devices
E Takeda - Microelectronics Reliability, 1993 - Elsevier
… Despite many experiments and analyses [6] on AC hot-carrier effects, noise caused by the
… current) hot-carrier effects, an universal guideline on AC hot-carrier effects is proposed from …
… current) hot-carrier effects, an universal guideline on AC hot-carrier effects is proposed from …
Hot-carrier effects in submicrometre MOS VLSIs
E Takeda - IEE Proceedings I (Solid-State and Electron Devices), 1984 - IET
… of hot-carrier effects in submicrometre MOS VLSIs are described: (a) the hot-carrier injection
mechanism, (b) device … ), (c) the device structure that will lead to an attenuation of hotcarrier …
mechanism, (b) device … ), (c) the device structure that will lead to an attenuation of hotcarrier …
Performance and hot-carrier effects of small CRYO-CMOS devices
M Aoki, S Hanamura, T Masuhara… - … on electron devices, 1987 - ieeexplore.ieee.org
… of MOS devices has several advantages, it has been pointed out that the hot-carrier effect
is … Therefore, at present a major concern is the hot-carrier limitation in submicrometerchannel …
is … Therefore, at present a major concern is the hot-carrier limitation in submicrometerchannel …
Analyzing hot-carrier effects on cold CMOS devices
SB Bibyk, H Wang, P Borton - … transactions on electron devices, 1987 - ieeexplore.ieee.org
… Hot-carrier effects were observed by operating these devices for several days in liquid
nitrogen and a supply voltage of 20 V. Only a 1-percent decrease in frequency was observed. …
nitrogen and a supply voltage of 20 V. Only a 1-percent decrease in frequency was observed. …
Hot carrier effects in MOS transistors
T Poorter, P Zoestbergen - 1984 International Electron Devices …, 1984 - ieeexplore.ieee.org
… From a comparison of IV curves before and after the hot carrier … effect of such a hot carrier
stress we measured the time dependence of transistor characteristics on many single devices …
stress we measured the time dependence of transistor characteristics on many single devices …
The energy-driven paradigm of NMOSFET hot-carrier effects
SE Rauch, G La Rosa - IEEE Transactions on Device and …, 2005 - ieeexplore.ieee.org
… The hot-carrier data for both device types clearly showed the three current regimes we
reported earlier [3], [4]. Data from the first two regimes were only considered here, to correspond …
reported earlier [3], [4]. Data from the first two regimes were only considered here, to correspond …
Channel hot carrier effects in n-MOSFET devices of advanced submicron CMOS technologies
G La Rosa, SE Rauch III - Microelectronics Reliability, 2007 - Elsevier
… A review of the channel hot carrier (CHC) mechanism and its effects on n-MOSFET devices
of … of hot carrier behavior for n-MOSFET devices at or below the 180 nm technology node. …
of … of hot carrier behavior for n-MOSFET devices at or below the 180 nm technology node. …
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