We report a method for probing electromechanical properties of multiwalled carbon nanotubes (CNTs). This method is based on atomic force microscopy measurements on a doubly clamped suspended CNT electrostatically deflected by a gate electrode. We measure the maximum deflection as a function of the applied gate voltage. Data from different CNTs scale into an universal curve within the experimental accuracy, in agreement with a continuum model prediction. This method and the general validity of the scaling law constitute a very useful tool for designing actuators and in general conducting nanowire-based nanoelectromechanical systems.