We report a resistive probe that detects electric field by field-induced resistance changes in
a small resistive region at the apex of the tip and demonstrate a method of imaging
ferroelectric domains at high speed, which is named scanning resistive probe microscopy
SRPM. We designed and fabricated the probe by self-aligning process that readily
implemented the resistive region at the tip apex. In order to measure the field sensitivity, we
contacted the probe with a thermally oxidized silicon sample and detected a 0.3% resistance …