Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters
Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past
few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices,
and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in
overlay printing registration accuracy (OPRA) is a key challenge to attain the high degree of
TFT integration through R2Rg. To address this challenge efficiently, a digital twin paradigm
was first introduced in the R2Rg system with an aim to optimize the OPRA by developing a …
few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices,
and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in
overlay printing registration accuracy (OPRA) is a key challenge to attain the high degree of
TFT integration through R2Rg. To address this challenge efficiently, a digital twin paradigm
was first introduced in the R2Rg system with an aim to optimize the OPRA by developing a …
[引用][C] Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process …
Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past
few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices,
and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in
overlay printing registration accuracy (OPRA) is a key challenge to attain the high degree of
TFT integration through R2Rg. To address this challenge efficiently, a digital twin paradigm
was first introduced in the R2Rg system with an aim to optimize the OPRA by developing a …
few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices,
and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in
overlay printing registration accuracy (OPRA) is a key challenge to attain the high degree of
TFT integration through R2Rg. To address this challenge efficiently, a digital twin paradigm
was first introduced in the R2Rg system with an aim to optimize the OPRA by developing a …
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