The term junction spectroscopy embraces a wide range of techniques used to explore the
properties of semiconductor materials and semiconductor devices. In this tutorial review, we
describe the most widely used junction spectroscopy approaches for characterizing deep-
level defects in semiconductors and present some of the early work on which the principles
of today's methodology are based. We outline ab-initio calculations of defect properties and
give examples of how density functional theory in conjunction with formation energy and …