X-ray peak profile analysis of silica by Williamson–Hall and size-strain plot methods
Journal of Physics: Conference Series, 2021•iopscience.iop.org
Annealed silica has been prepared by various annealing temperatures at 800 C and 1000
C. The crystallite size and lattice strain of silica were estimated by x-ray diffraction spectra
analysis using various calculation methods; Modified Scherrer, Williamson-Hall (WH), and
Size-Strain Plot. Qualitative analysis confirms that the XRD patterns were hexagonal quartz.
Annealing temperature cause a change in crystal size and lattice strain and all methods
showed a decrease in the value of the crystal size with increasing annealing temperature …
C. The crystallite size and lattice strain of silica were estimated by x-ray diffraction spectra
analysis using various calculation methods; Modified Scherrer, Williamson-Hall (WH), and
Size-Strain Plot. Qualitative analysis confirms that the XRD patterns were hexagonal quartz.
Annealing temperature cause a change in crystal size and lattice strain and all methods
showed a decrease in the value of the crystal size with increasing annealing temperature …
Abstract
Annealed silica has been prepared by various annealing temperatures at 800 C and 1000 C. The crystallite size and lattice strain of silica were estimated by x-ray diffraction spectra analysis using various calculation methods; Modified Scherrer, Williamson-Hall (WH), and Size-Strain Plot. Qualitative analysis confirms that the XRD patterns were hexagonal quartz. Annealing temperature cause a change in crystal size and lattice strain and all methods showed a decrease in the value of the crystal size with increasing annealing temperature from 800 C to 1000 C.
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