… that small-angle scattering of x rays can provide new information on the structural aspects of
porous silicon. … () In our porous silicon monocrystalline samples where TEM ob~ servations3 …

… silicon substrate (type and doping level) and the anodization conditions (HF concentration,
current density). In consequence, the so-called porous silicon … that porous silicon layers emit …

… low angles consist entirely of Si bonded to 0, the Si-Si density of states increasing with increasing
glancing angle, … In addition, the feature at - 1844 eV assigned to Si bonded to OH, also …

… Si ‘thin-film’ cell concepts. In a first concept, a 20 µm-thin Si solar cell is epitaxially grown
on top of a porous Si… is electrochemically etched in a low-cost UMG Si substrate. Large area …

… Variable-angle spectroscopic ellipsometry was used to determine … the porosity depth
profile and thickness of thin porous silicon layers produced by anodization of p + -doped silicon …

… In conclusion, a small-angle scattering study has been performed on porous silicon
layers when the porosity of the samples is increased from 55% to 85% for which a strong …

… small angle scattering of X-rays or neutrons as shown by Godeau et al. [4]. Compared to bulk
silicon the small angle … 6 shows a plot of the scattered intensity at small angles as a function …

… Small-angle scattering of X-rays (SAXS) can lead to a better understanding of the microstructrue
of porous silicon because the pore radii range (210 nm) corresponds to the small-angle …

… In all the studies realized till now, the porous silicon layers were always supported by the …
possible to detach the porous silicon layer from the substrate. We performed small-angle X-ray …

… -layer optical model used for analyzing porous silicon layers. (b) Experimental (——) and
calculated (- - -) Δ and Ψ spectra for a porous silicon layer … Thickness, volume porosity and their …