Since the invention of scanning tunnelling microscopy (STM)[1] and atomic force microscopy
(AFM)[2], a new class of local probe microscopes has entered the laboratories around the …

The invention of scanning tunneling microscopy (STM) by Binnig and Rohrer [1–3] and
atomic force microscopy (AFM) by Binnig et al.[4] has unleashed the development of a new …

There have been many books published on scanning tunneling microscopy (STM), atomic
force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer …

This book explains the operating principles of atomic force microscopy and scanning
tunneling microscopy. The aim of this book is to enable the reader to operate a scanning …

Surface science and nanotechnology are inherently coupled because of the increased
surface-to-volume ratio at the nanometer scale. Most of the exciting and astonishing …

The development of the scanning tunnelling microscope (STM) and its close relative the
atomic force microscope (AFM) or scanning force microscope (SFM) has proved to be one of …

The year 2008 marks the thirtieth anniversary of the Journal Scanning. The culmination of
scanning microscopy eventually led to Nobel prizes in 1986 for Ernst Ruska (electron …

This chapter shows that scanning tunneling microscopes (STMs), and atomic force
microscopes (AFMs), thanks to their ultimate resolution, can be viewed as the “end of the …

Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes,
and demonstrates the most widely used microscope in the family of microscopes--the …

The atomic force microscope (AFM) is a member of the family of scanning probe
microscopes, which makes use of specialized probes to scan a sample surface to produce …