[引用][C] Amorphous silicon

K Tanaka - 1999 - Wiley-Blackwell

Photoemission studies on in situ prepared hydrogenated amorphous silicon films

B Roedern, L Ley, M Cardona… - Philosophical Magazine …, 1979 - Taylor & Francis
Photoemission studies involving the valence and core levels of doped and undoped
amorphous hydrogenated silicon (a-Si: H) prepared by the glow-discharge method are …

Integral thin film technology amorphous silicon image sensor

CA Sassaki, AT Arasaki, MP Carreno… - Journal of Non …, 1989 - Elsevier
Image sensors have been made with PIN layers of amorphous hydrogenated silicon on
glass covered with transparent conductor constituted by 16 sensor cells of individual access …

Staebler-Wronski effect in hydrogenated amorphous silicon and related alloy films

T Shimizu - Japanese journal of applied physics, 2004 - iopscience.iop.org
Hydrogenated amorphous silicon and related alloy films have attracted much attention
because of the wide application of these films in devices such as thin-film transistors and …

From amorphous to microcrystalline silicon films prepared by hydrogen dilution using the VHF (70 MHz) GD technique

U Kroll, J Meier, P Torres, J Pohl, A Shah - Journal of Non-Crystalline Solids, 1998 - Elsevier
The amorphous and microcrystalline silicon films have been prepared by hydrogen dilution
from pure silane to silane concentrations≥ 1.25%. At silane concentrations of less than …

Differences in the densities of charged defect states and kinetics of Staebler–Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin films

M Güneş, CR Wronski - Journal of applied physics, 1997 - pubs.aip.org
A variety of undoped (nonintrinsic) hydrogenated amorphous silicon (a-Si: H) thin films was
studied in greater detail using steady-state photoconductivity, σ ph, subband-gap …

Influence of argon partial pressure on the electrical and optical properties of sputtered hydrogenated amorphous silicon

R Swanepoel, PL Swart, H Aharoni - Thin solid films, 1985 - Elsevier
Thin films of amorphous silicon were prepared by rf sputtering under constant hydrogen
partial pressure and various argon partial pressures. The dark conductivity and …

Electrical and optical properties of amorphous hydrogenated silicon prepared by reactive ion beam sputtering

J Singh, RC Budhani, KL Chopra - Journal of applied physics, 1984 - pubs.aip.org
Amorphous hydrogenated silicon (a‐Si: H) films have been prepared by a reactive ion beam
sputtering technique under different conditions of substrate temperature (300–623 K) and …

Extremely Narrow Band Gap,∼ 1· 50Ev, Amorphous Silicon

K Fukutani, T Sugawara, W Futako… - MRS Online …, 1998 - cambridge.org
Hydrogenated amorphous silicon (a-Si: H) films were prepared by a layer-by-layer (LBL)
argon treatment technique. Thin amorphous silicon layers are first deposited and then …

Improvement in the optoelectronic properties of a-SiO: H films

D Das, SM Iftiquar, D Das, AK Barua - Journal of materials science, 1999 - Springer
Hydrogenated amorphous silicon oxide (a-SiO: H) films prepared by rf plasma enhanced
chemical vapour deposition (PECVD) method have recently proved their potential as a …