Six years ago, things were looking bleak in the secondary ion MS (SIMS) community.
According to researchers, the field had reached maturity, and not much was new. The AC …

With secondary Ionmass spectrometry (SIMS), mass spectra can be generated as a function
of the sample surface spatial coordnates. Often In a sample analysis, however, the number …

The basic principle of SIMS is that a focused beam of energetic ions (so-called primary ions)
is targeted onto the surface of a solid sample. Primary ions dissipate their energy, leading to …

This book was written to explain a technique that requires an understanding of many details
in order to properly obtain and interpret the data obtained. It also will serve as a reference for …

Abstract On September 1, 1985, Secondary Ion Mass Spectrometry (SIMS) celebrated its
75th birthday, a milestone that provides us with a good reason to take a close look at the …

This book is the proceedings of the Sixth International Conference on Secondary Ion Mass
Spectrometry (SIMS VI) held in Paris in 1987. The sections cover basics, instrumentation …

Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster
secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass …

A mechanism of ion production from sub-monolayers of organics adsorbed on a surface is
proposed. This mechanism is used to explain why preformed ions are observed with greater …

Secondary ion mass spectrometry, SIMS, is the mass spectrometry of ionized particles that
are emitted when a surface, usually a solid, is bombarded by energetic primary particles …

Contrary to common opinion, secondary ion mass spectrometry (SIMS) has been with us for
more than half a century under various guises, the most recent reincarnation being FAB (fast …