Analyzing hot-carrier effects on cold CMOS devices
SB Bibyk, H Wang, P Borton - IEEE transactions on electron …, 1987 - ieeexplore.ieee.org
The operation of discrete and integrated CMOS ring oscillators was evaluated over the
temperature range 77-300 K. Gate delays typically decreased by a factor of two at 77 K. Hot …
temperature range 77-300 K. Gate delays typically decreased by a factor of two at 77 K. Hot …
A model for AC hot-carrier degradation in n-channel MOSFETs
K Mistry, B Doyle - IEEE electron device letters, 1991 - ieeexplore.ieee.org
A recently developed model for AC hot-carrier lifetimes is shown to be valid for typical and
worst-case stress waveforms found in CMOS circuits. Three hot-carrier damage mechanisms …
worst-case stress waveforms found in CMOS circuits. Three hot-carrier damage mechanisms …
Hot carrier effects on jitter and phase noise in CMOS voltage-controlled oscillators
C Zhang, A Srivastava - Noise in Devices and Circuits III, 2005 - spiedigitallibrary.org
The effects of hot carrier stress on CMOS voltage-controlled oscillators (VCO) are
investigated. A model of the threshold voltage degradation in MOSFETs due to hot carrier …
investigated. A model of the threshold voltage degradation in MOSFETs due to hot carrier …
Thermal effects in n-channel enhancement MOSFET's operated at cryogenic temperatures
DP Foty, SL Titcomb - IEEE Transactions on Electron Devices, 1987 - ieeexplore.ieee.org
Thermal effects in n-channel enhancement-mode MOSFET's operated at cryogenic
temperatures are discussed. Device heating is identified as the cause of drain current …
temperatures are discussed. Device heating is identified as the cause of drain current …
Hot carrier effects on jitter performance in CMOS voltage-controlled oscillators
C Zhang, A Srivastava - Fluctuation and Noise Letters, 2006 - World Scientific
The effects of hot carrier stress on CMOS voltage-controlled oscillators (VCO) are
investigated. A model of the threshold voltage degradation in MOSFETs due to hot carrier …
investigated. A model of the threshold voltage degradation in MOSFETs due to hot carrier …
A study of the increased effects of hot-carrier stress on NMOSFETs at low temperature
A Acovic, M Dutoit, M Ilegems - IEEE Transactions on Electron …, 1989 - ieeexplore.ieee.org
It is well known that hot-carrier (HC) degradation of NMOSFETs is enhanced at low
temperature (LT). Up to now, this has mainly been attributed to the greater mean free path of …
temperature (LT). Up to now, this has mainly been attributed to the greater mean free path of …
Transient substrate current generation and device degradation in CMOS circuits at 77K
DH Ju, RK Reich, JW Schrankler… - 1985 International …, 1985 - ieeexplore.ieee.org
The hot-carrier effects on CMOS device characteristics and circuit performance have been
investigated at 77K under pulsed-stress conditions. A CMOS inverter was subjected to a …
investigated at 77K under pulsed-stress conditions. A CMOS inverter was subjected to a …
Hot carriers in small geometry CMOS
LA Akers, MA Holly, C Lund - 1984 International Electron …, 1984 - ieeexplore.ieee.org
The effects of hot carriers on the electrical behavior of small geometry NMOS and PMOS
devices are reported. Significant changes in device characteristics are shown to occur even …
devices are reported. Significant changes in device characteristics are shown to occur even …
[PDF][PDF] Simulation of CMOS circuit degradation due to hot-carrier effects
KN Quader, PK Ko, C Hu, P Fang… - IEEE IRPS-92, Tech …, 1992 - researchgate.net
Comparing long term ring-oscillator hot-carrier degradation data and simulation results we
show that a public-domain circuit simulatOr BERT can predict CMOS digital circuit speed …
show that a public-domain circuit simulatOr BERT can predict CMOS digital circuit speed …
Modeling of circuits with strongly temperature dependent thermal conductivities for cryogenic CMOS
When designing and studying circuits operating at cryogenic temperatures understanding
local heating within the circuits is critical due to the temperature dependence of transistor …
local heating within the circuits is critical due to the temperature dependence of transistor …