The scanning transmission electron microscope (STEM) is an invaluable tool for the
characterization of nanostructures, providing a range of different imaging modes with the …

The maximum image acquisition rate for conventional SEM is limited by many factors related
to both the instrumentation used and the physics of secondary electron image formation. The …

Atomic-scale electron microscopy traditionally probes thin specimens, with thickness below
100 nm, and its feasibility for bulk samples has not been documented. In this study, we …

A focused ion beam (FIB) has been actively applied for preparation of about 0.1-μ m-thick
specimens for transmission electron microscopes (TEMs). For device failure analyses …

Electron–electron interactions and detector bandwidth limit the maximal imaging speed of
single‐beam scanning electron microscopes. We use multiple electron beams in a single …

Although scanning transmission electron microscopy (STEM) images of individual heavy
atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging …

Recent developments in a number of fields call for high-throughput, high-resolution imaging
of large areas. Examples are reconstruction of macroscopic volumes of mouse brain tissue …

The imaging benefits of field emission SEM are clear: edge resolution down to ten or so
nanometers, particularly for secondary electron images. Edge resolution is defined as the …

Transmission electron imaging with standard scanning electron microscopes (SEMs) can be
implemented simply by equipping the SEM with a readily available transmission detector …

Low-voltage transmission electron microscopy (≤ 80 kV) has many applications in imaging
beam-sensitive samples, such as metallic nanoparticles, which may become damaged at …