Structural, morphological and optical properties of n-type porous silicon-effect of etching current density
HK Abood, FAH Mutlak - IOP Conference Series: Materials …, 2020 - iopscience.iop.org
Porous silicon layers have been prepared from n-type silicon wafers of (111) orientation.
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …
Structural, Morphological and Optical properties of n-type Porous Silicon-effect of Etching Current Density
HK Abood, F AH Mutlak - Materials Science and …, 2020 - ui.adsabs.harvard.edu
Porous silicon layers have been prepared from n-type silicon wafers of (111) orientation.
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …
Structural, Morphological and Optical properties of n-type Porous Silicon-effect of Etching Current Density
HK Abood, FAH Mutlak - IOP Conference Series. Materials …, 2020 - search.proquest.com
Porous silicon layers have been prepared from n-type silicon wafers of (111) orientation.
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …
XRD, AFM, reflectivity and PL have been used to characterize the structural, morphological …