Electromigration-aware analog Router with multilayer multiport terminal structures

R Martins, N Lourenco, A Canelas, N Horta - Integration, 2014 - Elsevier
The combined effects of current densities and temperature in the interconnects may cause
the failure of a circuit due to electromigration (EM). EM becomes increasingly more relevant …
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[引用][C] Electromigration-aware analog Router with multilayer multiport terminal structures

R MARTINS, N LOURENCO… - Integration …, 2014 - pascal-francis.inist.fr
Electromigration-aware analog Router with multilayer multiport terminal structures CNRS Inist
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Electromigration-aware analog Router with multilayer multiport terminal structures

R Martins, N Lourenço, A Canelas, N Horta - Integration, the VLSI Journal, 2014 - infona.pl
The combined effects of current densities and temperature in the interconnects may cause
the failure of a circuit due to electromigration (EM). EM becomes increasingly more relevant …

[引用][C] Electromigration-aware analog Router with multilayer multiport terminal structures

R Martins, N Lourenço, A Canelas, N Horta - Integration, 2014 - cir.nii.ac.jp
Electromigration-aware analog Router with multilayer multiport terminal structures | CiNii
Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 …

Electromigration-aware analog Router with multilayer multiport terminal structures

R Martins, N Lourenço, A Canelas, N Horta - Integration, the VLSI Journal, 2014 - infona.pl
The combined effects of current densities and temperature in the interconnects may cause
the failure of a circuit due to electromigration (EM). EM becomes increasingly more relevant …

[引用][C] Electromigration-aware analog Router with multilayer multiport terminal structures

R MARTINS, N LOURENCO, A CANELAS, N HORTA - Integration, 2014 - Elsevier