High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - Nature, 2017 - nature.com
Modern nanoelectronics, has advanced to a point at which it is impossible to image entire
devices and their interconnections non-destructively because of their small feature sizes and …
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High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - Nature, 2017 - econpapers.repec.org
EconPapers: High-resolution non-destructive three-dimensional imaging of integrated circuits
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High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - Nature, 2017 - ideas.repec.org
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High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - Nature, 2017 - go.gale.com
Modern nanoelectronics [1, 2] has advanced to a point at which it is impossible to image
entire devices and their interconnections non-destructively because of their small feature …

High-resolution non-destructive three-dimensional imaging of integrated circuits.

M Holler, M Guizar-Sicairos, EH Tsai, R Dinapoli… - Nature, 2017 - folia.unifr.ch
English Modern nanoelectronics has advanced to a point at which it is impossible to image
entire devices and their interconnections non-destructively because of their small feature …

[引用][C] High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai… - …, 2017 - research-collection.ethz.ch
High-resolution non-destructive three-dimensional imaging of integrated circuits - Research
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High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai… - …, 2017 - pubmed.ncbi.nlm.nih.gov
Modern nanoelectronics has advanced to a point at which it is impossible to image entire
devices and their interconnections non-destructively because of their small feature sizes and …

High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - …, 2017 - ui.adsabs.harvard.edu
Modern nanoelectronics has advanced to a point at which it is impossible to image entire
devices and their interconnections non-destructively because of their small feature sizes and …

High-resolution non-destructive three-dimensional imaging of integrated circuits.

M Holler, M Guizar-Sicairos, EH Tsai, R Dinapoli… - Nature, 2017 - europepmc.org
Modern nanoelectronics has advanced to a point at which it is impossible to image entire
devices and their interconnections non-destructively because of their small feature sizes and …

[引用][C] High-resolution non-destructive three-dimensional imaging of integrated circuits

M Holler, M Guizar-Sicairos, EHR Tsai, R Dinapoli… - Nature, 2017 - cir.nii.ac.jp
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