A framework for evaluating automatic classification of underlying causes of disturbances and its application to short-circuit faults

J Morais, Y Pires, C Cardoso… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
Most works in power systems event classification concern classifying an event according to
the morphology of the corresponding waveform. An important and even more difficult …
被引用次数：30 相关文章

[引用][C] A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances and Its Application to Short-Circuit Faults

J MORAIS, Y PIRES, C CARDOSO… - IEEE transactions on …, 2010 - pascal-francis.inist.fr
A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances
and Its Application to Short-Circuit Faults CNRS Inist Pascal-Francis CNRS Pascal and …

A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances and Its Application to Short-Circuit Faults

J Morais, Y Pires, C Cardoso, A Klautau - IEEE Transactions on Power …, 2010 - infona.pl
Most works in power systems event classification concern classifying an event according to
the morphology of the corresponding waveform. An important and even more difficult …
[PDF] researchgate.net

[PDF][PDF] A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances and its Application to Short-Circuit Faults

J Morais, Y Pires, C Cardoso Jr, A Klautau - researchgate.net
Most works in power systems event classification concern classifying an event according to
the morphology of the corresponding waveform. An important and even more difficult …
[PDF] academia.edu

[PDF][PDF] A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances and its Application to Short-Circuit Faults

J Morais, Y Pires, C Cardoso Jr, A Klautau - academia.edu
Most works in power systems event classification concern classifying an event according to
the morphology of the corresponding waveform. An important and even more difficult …

[引用][C] A Framework for Evaluating Automatic Classification of Underlying Causes of Disturbances and Its Application to Short-Circuit Faults

J MORAIS, Y PIRES… - IEEE …, 2010 - Institute of Electrical and Electronics …