Transient Photoluminescence Microscopy (TPLM) allows for the direct visualization of carrier transport in semiconductor materials with sub nanosecond and few nanometer resolution. The technique is based on measuring changes in the spatial distribution of a diffraction limited population of carriers using spatiotemporal detection of the radiative decay of the carriers. The spatial resolution of TPLM is therefore primarily determined by the signal-to-noise-ratio (SNR). Here we present a method using cylindrical lenses to boost the signal acquisition in TPLM experiments. The resulting asymmetric magnification of the photoluminescence emission of the diffraction limited spot can increase the collection efficiency by more than a factor of 10, significantly reducing acquisition times and further boosting spatial resolution.