Characterization of orientational order in π-conjugated molecular thin films by NEXAFS
T Breuer, M Klues, G Witte - Journal of Electron Spectroscopy and Related …, 2015 - Elsevier
Enabled by the improved availability of synchrotron facilities, near-edge X-ray absorption
fine structure (NEXAFS) spectroscopy has become a widely used technique, especially due
to its tunable, potentially very high, surface-sensitivity and its capability of analyzing the
electronic structure of unoccupied orbitals. In this article we describe the fundamentals and
technical requirements for NEXAFS spectroscopy with special focus on its application to the
structural characterization of organic thin films. Based on prominent examples we discuss …
fine structure (NEXAFS) spectroscopy has become a widely used technique, especially due
to its tunable, potentially very high, surface-sensitivity and its capability of analyzing the
electronic structure of unoccupied orbitals. In this article we describe the fundamentals and
technical requirements for NEXAFS spectroscopy with special focus on its application to the
structural characterization of organic thin films. Based on prominent examples we discuss …