In this work, the application of a voltage over-scaling (VOS) technique for improving the lifetime and reliability of coarse-grained reconfigurable architectures (GCRAs) is presented. The proposed technique, which may be applied to CGRAs used as accelerators for low-power, error-tolerant applications, reduces the (strongly voltage-dependent) wearout effects and the energy consumption of processing elements (PEs) whenever the error impact on the output quality degradation can be tolerated. This provides us with the ability to lessen the wearout and reduce energy consumption of PEs when accuracy requirement for the results is rather low. Multiple degrees of computational accuracy can be achieved by using different overscaled voltage levels for the PEs. The efficacy of the proposed technique is studied by considering the bias temperature instability. The study is performed for two error-resilient applications. The CGRAs are implemented with 15nm FinFET operating at a nominal supply voltage of 0.8V. In addition, supply voltages of 0.75, 0.7, 0.65, and 0.6V are considered as overscaled voltage levels for this technology. Based on the quality constraint requirements of the benchmarks, optimum overscaled voltage levels for various PEs are determined and utilized. The approach may provide considerable lifetime and energy consumption improvements over those of the conventional exact and approximate computation approaches.