High-k metal gate fundamental learning and multi-Vt options for stacked nanosheet gate-all-around transistor

J Zhang, T Ando, CW Yeung, M Wang… - 2017 IEEE …, 2017 - ieeexplore.ieee.org
In this paper, we report multi-threshold-voltage (multi-Vt) options for stacked Nanosheet gate-
all-around (GAA) transistors. V t can be modulated through workfunction metal (WFM)
thickness as well as the inter-nanosheet spacing (T sus), the combination of which may be
leveraged to increase the number of undoped V t offerings within a CMOS device menu
relative to a FinFET CMOS device menu, which fundamentally does not have T sus as a V t
tuning option. Hence we propose our multi-V t scheme by taking advantage of the unique …

[引用][C] High-k metal gate fundamental learning and multi-V

J Zhang - IEDM Tech. Dig, 2017

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