In-depth resolved Raman scattering analysis for the identification of secondary phases: characterization of Cu2ZnSnS4 layers for solar cell applications
X Fontané, L Calvo-Barrio, V Izquierdo-Roca… - Applied Physics …, 2011 - pubs.aip.org
This work reports the in-depth resolved Raman scattering analysis with different excitation
wavelengths of Cu 2 ZnSnS 4 layers. Secondary phases constitute a central problem in this
material, particularly since they cannot be distinguished by x-ray diffraction. Raman spectra
measured with 325 nm excitation light after sputtering the layers to different depths show
peaks that are not detectable by excitation in the visible. These are identified with Cu 3 SnS
4 modes at the surface region while spectra measured close to the back region show peaks …
wavelengths of Cu 2 ZnSnS 4 layers. Secondary phases constitute a central problem in this
material, particularly since they cannot be distinguished by x-ray diffraction. Raman spectra
measured with 325 nm excitation light after sputtering the layers to different depths show
peaks that are not detectable by excitation in the visible. These are identified with Cu 3 SnS
4 modes at the surface region while spectra measured close to the back region show peaks …
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