Probing the local temperature by in situ electron microscopy on a heated Si3N4 membrane

A Reguer, F Bedu, S Nitsche, D Chaudanson… - Ultramicroscopy, 2009 - Elsevier
We present a method allowing us to obtain localized heating that is compatible with high-
temperature operation and real time scanning and transmission electron microscopy.
Localized heating is induced by flowing current through tungsten nanowires deposited by
focused ion-beam-induced deposition on a 50-nm-thick Si3N4 membrane. Based on the
heat transport between the nanowire and the substrate, we applied an analytical model to
obtain the temperature profile as a function of electrical power. In this model, the key …
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