[PDF][PDF] Seismic refraction method: A technique for determining the thickness of stratified substratum
O Anomohanran - American Journal of Applied Sciences, 2013 - researchgate.net
American Journal of Applied Sciences, 2013•researchgate.net
The seismic refraction survey is a very important geophysical technique used in the
investigation of subsurface characteristics. This is why this study was carried out to
emphasize the ability of the seismic refraction method in determining the thickness of
stratified layers of soil and rock. The results obtained are generalized expressions that relate
travel time, offset distance, velocity and thickness of subsurface layers.
investigation of subsurface characteristics. This is why this study was carried out to
emphasize the ability of the seismic refraction method in determining the thickness of
stratified layers of soil and rock. The results obtained are generalized expressions that relate
travel time, offset distance, velocity and thickness of subsurface layers.
Abstract
The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.
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