With the development of multi-modal x-ray imaging techniques, dark-field signals have
drawn increasing interest due to the complementary information to the conventional
attenuation-contrast signal. The directional sensitivity of the dark-field signal can reveal the
orientation of the microstructure of the imaged object. We propose to use single-shot dark-
field imaging with a random-pattern wavefront modulator to achieve omni-directional
sensitivity, which will be valuable for the study of strongly ordered systems. Compared to …