Submicrometer single crystal diffractometry for highly accurate structure determination
N Yasuda, Y Fukuyama, K Toriumi, S Kimura… - AIP Conference …, 2010 - pubs.aip.org
Submicrometer single crystal diffractometry for highly accurate structure determination was
developed using the extremely stable and highly brilliant synchrotron radiation from SPring‐
8. This was achieved using a microbeam focusing system and the submicrometer precision
low‐eccentric goniometer system. We demonstrated the structure analyses with 2× 2× 2 μ m
3 cytidine, 600× 600× 300 nm 3 BaTiO 3, and 1× 1× 1 μ m 3 silicon. The observed structure
factors of the silicon crystal were in agreement with the structure factors determined by the …
developed using the extremely stable and highly brilliant synchrotron radiation from SPring‐
8. This was achieved using a microbeam focusing system and the submicrometer precision
low‐eccentric goniometer system. We demonstrated the structure analyses with 2× 2× 2 μ m
3 cytidine, 600× 600× 300 nm 3 BaTiO 3, and 1× 1× 1 μ m 3 silicon. The observed structure
factors of the silicon crystal were in agreement with the structure factors determined by the …
以上显示的是最相近的搜索结果。 查看全部搜索结果