[HTML][HTML] Use of the drift-time method to measure the electron lifetime in long-drift-length CdZnTe detectors
AE Bolotnikov, GS Camarda, E Chen, R Gul… - Journal of Applied …, 2016 - pubs.aip.org
The traditional method for electron lifetime measurements of CdZnTe (CZT) detectors relies
on using the Hecht equation. The procedure involves measuring the dependence of the
detector response on the applied bias to evaluate the μτ product, which in turn can be
converted into the carrier lifetime. Despite general acceptance of this technique, which is
very convenient for comparative testing of different CZT materials, the assumption of a
constant electric field inside a detector is unjustified. In the Hecht equation, this assumption …
on using the Hecht equation. The procedure involves measuring the dependence of the
detector response on the applied bias to evaluate the μτ product, which in turn can be
converted into the carrier lifetime. Despite general acceptance of this technique, which is
very convenient for comparative testing of different CZT materials, the assumption of a
constant electric field inside a detector is unjustified. In the Hecht equation, this assumption …
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