Modern nanoelectronics, has advanced to a point at which it is impossible to image entire
devices and their interconnections non-destructively because of their small feature sizes and …

The imaging of integrated circuits across different length scales is required for failure
analysis, design validation and quality control. At present, such inspection is accomplished …

Coherent diffractive imaging (CDI) and scanning transmission x-ray microscopy (STXM) are
two popular microscopy techniques that have evolved quite independently. CDI promises to …

Hard X-ray lens-less microscopy raises hopes for a non-invasive quantitative imaging,
capable of achieving the extreme resolving power demands of nanoscience. However, a …

The smaller pixel size and high frame rate of next-generation photon counting pixel
detectors opens new opportunities for the application of X-ray coherent diffractive imaging …

Coherent X-ray microscopy by phase retrieval of Bragg diffraction intensities enables lattice
distortions within a crystal to be imaged at nanometre-scale spatial resolutions in three …

Ptychographic x-ray diffraction microscopy is a lensless imaging technique with a large field
of view and high spatial resolution, which is also useful for characterizing the wavefront of an …

Ptychography is a coherent diffraction imaging technique that measures diffraction patterns
at many overlapping points on a sample and then uses an algorithm to reconstruct …

With the increasing importance of nanotechnology, the need for reliable real-time imaging of
mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning …

Advances in science, medicine and engineering rely on breakthroughs in imaging,
particularly for obtaining multiscale, three-dimensional information from functional systems …