I–V characteristics of Schottky contacts based on quantum wires
In this paper we derive the I–V characteristics of Schottky contacts based on bulk metal to
semiconductor quantum wires interfaces. The obtained results show that quantum …
semiconductor quantum wires interfaces. The obtained results show that quantum …
Modeling the electrical characteristics of Schottky contacts in low-dimensional heterostructure devices
This paper deals with the modeling of the electronic characteristics of semiconductor
devices based on Schottky contacts in low-dimensional systems. For the capacitance …
devices based on Schottky contacts in low-dimensional systems. For the capacitance …
Capacitance-voltage characteristics of multiple-quantum-well semiconductor heterostructures
M Ershov, V Ryzhii, K Saito - Journal of Physics D: Applied …, 1995 - iopscience.iop.org
The capacitance-voltage (CV) characteristics of multiple-quantum-well (MQW)
semiconductor heterostructures are studied using a proposed numerical model. The MQW …
semiconductor heterostructures are studied using a proposed numerical model. The MQW …
Low dimensionality electronic devices based on heterodimensional Schottky contacts: Modeling and experimental results
This paper discusses the modeling and experimental results for a new family of electronic
devices in which a Schottky metal is placed in direct contact to a low dimensionality structure …
devices in which a Schottky metal is placed in direct contact to a low dimensionality structure …
[HTML][HTML] The dependence of Schottky junction (I–V) characteristics on the metal probe size in nano metal–semiconductor contacts
We have studied the dependence of Schottky junction (I–V) characteristics on the metal
contact size in metal–semiconductor (M–S) junctions using different metal nanoprobe sizes …
contact size in metal–semiconductor (M–S) junctions using different metal nanoprobe sizes …
Electrical properties of nanometer-sized Schottky contacts for gate control of III–V single electron devices and quantum devices
T Sato, S Kasai, H Hasegawa - Japanese Journal of Applied …, 2001 - iopscience.iop.org
The electrical properties of nanometer-sized Schottky contacts formed on n-GaAs and n-InP
substrates by an in situ electrochemical process were studied both experimentally and …
substrates by an in situ electrochemical process were studied both experimentally and …
Influence of Schottky barrier on conductance of a metal-semiconductor atomic quantum point contact
M Wawrzyniak, S Michalak, D Tomaszewski… - Applied Physics …, 2016 - pubs.aip.org
We have studied the conductance of nanoscale junctions created at a metal-semiconductor
interface by the break-junction technique. The conductance traces of the nanojunctions …
interface by the break-junction technique. The conductance traces of the nanojunctions …
[HTML][HTML] Prospects of silicide contacts for silicon quantum electronic devices
K Tsoukalas, F Schupp, L Sommer, I Bouquet… - Applied Physics …, 2024 - pubs.aip.org
Metal contacts in semiconductor quantum electronic devices can offer advantages over
doped contacts, primarily due to their reduced fabrication complexity and lower temperature …
doped contacts, primarily due to their reduced fabrication complexity and lower temperature …
Schottky-barrier height inhomogeneities controlled by buried Ge/Si quantum dots
A Hattab, V Aubry-Fortuna, F Meyer, V Yam… - Microelectronic …, 2002 - Elsevier
In this work, we investigated W/p-type Si Schottky contacts with intentional inhomogeneities
beneath the interface. These inhomogeneities are related to the presence of Ge-dots located …
beneath the interface. These inhomogeneities are related to the presence of Ge-dots located …
Evaluation of Schottky contact parameters in metal–semiconductor–metal photodiode structures
S Averine, YC Chan, YL Lam - Applied Physics Letters, 2000 - pubs.aip.org
The electrical behavior of metal–semiconductor–metal MSM Schottky barrier photodiode
structures is analyzed by means of current–voltage measurements at different temperatures …
structures is analyzed by means of current–voltage measurements at different temperatures …
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