I–V characteristics of Schottky contacts based on quantum wires

R Ragi, MA Romero - Microelectronics journal, 2006 - Elsevier
In this paper we derive the I–V characteristics of Schottky contacts based on bulk metal to
semiconductor quantum wires interfaces. The obtained results show that quantum …

Modeling the electrical characteristics of Schottky contacts in low-dimensional heterostructure devices

R Ragi, MA Romero, B Nabet - IEEE transactions on electron …, 2005 - ieeexplore.ieee.org
This paper deals with the modeling of the electronic characteristics of semiconductor
devices based on Schottky contacts in low-dimensional systems. For the capacitance …

Capacitance-voltage characteristics of multiple-quantum-well semiconductor heterostructures

M Ershov, V Ryzhii, K Saito - Journal of Physics D: Applied …, 1995 - iopscience.iop.org
The capacitance-voltage (CV) characteristics of multiple-quantum-well (MQW)
semiconductor heterostructures are studied using a proposed numerical model. The MQW …

Low dimensionality electronic devices based on heterodimensional Schottky contacts: Modeling and experimental results

MA Romero, R Ragi, B Nabet - 2008 Argentine School of Micro …, 2008 - ieeexplore.ieee.org
This paper discusses the modeling and experimental results for a new family of electronic
devices in which a Schottky metal is placed in direct contact to a low dimensionality structure …

[HTML][HTML] The dependence of Schottky junction (I–V) characteristics on the metal probe size in nano metal–semiconductor contacts

M Rezeq, A Ali, SP Patole, K Eledlebi, RK Dey, B Cui - AIP Advances, 2018 - pubs.aip.org
We have studied the dependence of Schottky junction (I–V) characteristics on the metal
contact size in metal–semiconductor (M–S) junctions using different metal nanoprobe sizes …

Electrical properties of nanometer-sized Schottky contacts for gate control of III–V single electron devices and quantum devices

T Sato, S Kasai, H Hasegawa - Japanese Journal of Applied …, 2001 - iopscience.iop.org
The electrical properties of nanometer-sized Schottky contacts formed on n-GaAs and n-InP
substrates by an in situ electrochemical process were studied both experimentally and …

Influence of Schottky barrier on conductance of a metal-semiconductor atomic quantum point contact

M Wawrzyniak, S Michalak, D Tomaszewski… - Applied Physics …, 2016 - pubs.aip.org
We have studied the conductance of nanoscale junctions created at a metal-semiconductor
interface by the break-junction technique. The conductance traces of the nanojunctions …

[HTML][HTML] Prospects of silicide contacts for silicon quantum electronic devices

K Tsoukalas, F Schupp, L Sommer, I Bouquet… - Applied Physics …, 2024 - pubs.aip.org
Metal contacts in semiconductor quantum electronic devices can offer advantages over
doped contacts, primarily due to their reduced fabrication complexity and lower temperature …

Schottky-barrier height inhomogeneities controlled by buried Ge/Si quantum dots

A Hattab, V Aubry-Fortuna, F Meyer, V Yam… - Microelectronic …, 2002 - Elsevier
In this work, we investigated W/p-type Si Schottky contacts with intentional inhomogeneities
beneath the interface. These inhomogeneities are related to the presence of Ge-dots located …

Evaluation of Schottky contact parameters in metal–semiconductor–metal photodiode structures

S Averine, YC Chan, YL Lam - Applied Physics Letters, 2000 - pubs.aip.org
The electrical behavior of metal–semiconductor–metal MSM Schottky barrier photodiode
structures is analyzed by means of current–voltage measurements at different temperatures …