Tackling signal electromigration with learning-based detection and multistage mitigation
With the continuous scaling of integrated circuit (IC) technologies, electromigration (EM)
prevails as one of the major reliability challenges facing the design of robust circuits. With …
prevails as one of the major reliability challenges facing the design of robust circuits. With …
Electromigration-aware interconnect design
SS Sapatnekar - Proceedings of the 2019 International Symposium on …, 2019 - dl.acm.org
Electromigration (EM) is seen as a growing problem in recent and upcoming technology
nodes, and affects a wider variety of wires (eg, power grid, clock/signal nets), circuits (eg …
nodes, and affects a wider variety of wires (eg, power grid, clock/signal nets), circuits (eg …
The need and opportunities of electromigration-aware integrated circuit design
Electromigration (EM) is becoming a progressively severe reliability challenge due to
increased interconnect current densities. A shift from traditional (post-layout) EM verification …
increased interconnect current densities. A shift from traditional (post-layout) EM verification …
Electromigration-aware redundant via insertion
As the feature size shrinks, electromigration (EM) becomes a more critical reliability issue in
IC design. EM around the via structures accounts for much of the reliability problems in ICs …
IC design. EM around the via structures accounts for much of the reliability problems in ICs …
On potential design impacts of electromigration awareness
Reliability issues significantly limit performance improvements from Moore's-Law scaling. At
45nm and below, electromigration (EM) is a serious reliability issue which affects global and …
45nm and below, electromigration (EM) is a serious reliability issue which affects global and …
Variation-aware electromigration analysis of power/ground networks
D Li, M Marek-Sadowska - 2011 IEEE/ACM International …, 2011 - ieeexplore.ieee.org
Due to shrinking wire dimensions, higher current density, and process variations,
electromigration (EM) has become a major reliability problem. The existing backend design …
electromigration (EM) has become a major reliability problem. The existing backend design …
A systematic approach for analyzing and optimizing cell-internal signal electromigration
Electromigration (EM) in on-chip metal interconnects is a critical reliability failure mechanism
in nanometer-scale technologies. This work addresses the problem of EM on signal …
in nanometer-scale technologies. This work addresses the problem of EM on signal …
An automated methodology to fix electromigration violations on a customized design flow
L de Paris, R Reis - 2018 IEEE 9th Latin American Symposium …, 2018 - ieeexplore.ieee.org
Electromigration (EM) effects have been a high concern in IC power delivery networks
design. As the integrated circuits dimensions become smaller and smaller, those effects …
design. As the integrated circuits dimensions become smaller and smaller, those effects …
WiT: optimal wiring topology for electromigration avoidance
IHR Jiang, HY Chang, CL Chang - IEEE transactions on very …, 2011 - ieeexplore.ieee.org
Due to excessive current densities, electromigration (EM) may trigger a permanent open-or
short-circuit failure in signal wires or power networks in analog or mixed-signal circuits. As …
short-circuit failure in signal wires or power networks in analog or mixed-signal circuits. As …
Machine learning based generic violation waiver system with application on electromigration sign-off
N Chang, A Baranwal, H Zhuang… - 2018 23rd Asia and …, 2018 - ieeexplore.ieee.org
Manually analyzing the results generated by EDA tools to waive or fix any violations is a
tedious, error-prone and time-consuming process. By automating these time-consuming …
tedious, error-prone and time-consuming process. By automating these time-consuming …