Towards nanoelectronics processor architectures
In this paper, we focus on reliability, one of the most fundamental and important challenges,
in the nanoelectronics environment. For a processor architecture based on the unreliable …
in the nanoelectronics environment. For a processor architecture based on the unreliable …
Towards Nanoelectronics Processor Architectures
W Rao, A Orailoglu, R Karri - Journal of Electronic Testing, 2007 - infona.pl
In this paper, we focus on reliability, one of the most fundamental and important challenges,
in the nanoelectronics environment. For a processor architecture based on the unreliable …
in the nanoelectronics environment. For a processor architecture based on the unreliable …
Towards Nanoelectronics Processor Architectures
W Rao, A Orailoglu, R Karri - Journal of Electronic Testing: Theory and …, 2007 - dl.acm.org
In this paper, we focus on reliability, one of the most fundamental and important challenges,
in the nanoelectronics environment. For a processor architecture based on the unreliable …
in the nanoelectronics environment. For a processor architecture based on the unreliable …
Towards Nanoelectronics Processor Architectures
W Rao, A Orailoglu, R Karri - Emerging Nanotechnologies: Test, Defect Tolerance … - Springer
CMOS technology has moved beyond 80 nanometers in scale, and according to the
International Technology Roadmap for Semiconductors (ITRS), is projected to reach beyond …
International Technology Roadmap for Semiconductors (ITRS), is projected to reach beyond …
Towards Nanoelectronics Processor Architectures
W Rao, A Orailoglu, R Karri - Journal of Electronic Testing …, 2007 - search.proquest.com
In this paper, we focus on reliability, one of the most fundamental and important challenges,
in the nanoelectronics environment. For a processor architecture based on the unreliable …
in the nanoelectronics environment. For a processor architecture based on the unreliable …
Towards nanoelectronics processor architectures
W Rao, A Orailoglu, R Karri - Journal of Electronic Testing …, 2007 - nyuscholars.nyu.edu
In this paper, we focus on reliability, one of the most fundamental and important challenges,
in the nanoelectronics environment. For a processor architecture based on the unreliable …
in the nanoelectronics environment. For a processor architecture based on the unreliable …