A fresh look at majority multiplexing when devices get into the picture

V Beiu, W Ibrahim… - 2007 7th IEEE …, 2007 - ieeexplore.ieee.org
In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX)
using majority (MAJ) gates of small fan-ins Δ (MAJ-Δ) with respect to the probability of failure …
被引用次数：20 相关文章

A fresh look at majority multiplexing when devices get into the picture

V Beiu, W Ibrahim… - 2007 7th IEEE …, 2007 - research.uaeu.ac.ae
In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX)
using majority (MAJ) gates of small fan-ins Δ (MAJ-Δ) with respect to the probability of failure …

A fresh look at majority multiplexing when devices get into the picture

V Beiu, W Ibrahim… - 2007 7th IEEE …, 2007 - portal.findresearcher.sdu.dk
In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX)
using majority (MAJ) gates of small fan-ins Δ (MAJ-Δ) with respect to the probability of failure …
[PDF] researchgate.net

[PDF][PDF] A Fresh Look at Majority Multiplexing When Devices Get into the Picture

V Beiu, W Ibrahim, S Lazarova-Molnar - researchgate.net
In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX)
using majority (MAJ) gates of small fan-ins (MAJ-) with respect to the probability of failure of …

A fresh look at majority multiplexing when devices get into the picture

V Beiu, W Ibrahim, S Lazarova-Molnar - 2007 7th IEEE Conference on … - infona.pl
In this paper we present the first detailed analysis of von Neumann multiplexing (vN-MUX)
using majority (MAJ) gates of small fan-ins Delta (MAJ-Delta) with respect to the probability …