Serial addition: Locally connected architectures

V Beiu, S Aunet, J Nyathi, RR Rydberg… - IEEE Transactions on …, 2007 - ieeexplore.ieee.org
This paper will briefly review nanoelectronic challenges while focusing on reliability. We
shall present and analyze a series of CMOS-based examples for addition starting from the …

[PDF][PDF] The vanishing majority gate trading power and speed for reliability

V Beiu, S Aunet, RR Rydberg III, A Djupdal… - Proc Int. Work. on Design …, 2005 - Citeseer
In this paper we are going to explore low-level implementation issues for fault-tolerant
adders based on multiplexing using majority gates (MAJ). We shall analyze the particular …

On the advantages of serial architectures for low-power reliable computations

V Beiu, S Aunet, J Nyathi, RR Rydberg… - … Processors (ASAP'05 …, 2005 - ieeexplore.ieee.org
This paper explores low power reliable micro-architectures for addition. Power, speed, and
reliability (both defect-and fault-tolerance) are important metrics of system design, spanning …

An evaluation of asynchronous addition

DJ Kinniment - IEEE Transactions on Very Large Scale …, 1996 - ieeexplore.ieee.org
There is considerable interest at present in the design of asynchronous systems based on
the use of self-timing components for arithmetic and other operations. Amongst the …

Area-time-power tradeoffs in parallel adders

C Nagendra, MJ Irwin… - IEEE Transactions on …, 1996 - ieeexplore.ieee.org
In this paper, several classes of parallel, synchronous adders are surveyed based on their
power, delay and area characteristics. The adders studied include the linear time ripple …

Low energy asynchronous architectures

I Obridko, R Ginosar - 2005 IEEE International Symposium on …, 2005 - ieeexplore.ieee.org
Asynchronous circuits are often presented as a means of achieving low power operation.
We investigate their suitability for low-energy applications, where long battery life and delay …

On computing nano-architectures using unreliable nano-devices

V Beiu, W Ibrahim - Nano and Molecular Electronics Handbook, 2018 - taylorfrancis.com
This chapter will start with a brief review of nanoelectronic challenges while focusing on the
reliability challenge. One of the most recent call-to-arms [1] raises two fundamental …

Threshold voltage variations make full adders reliabilities similar

W Ibrahim, V Beiu - IEEE transactions on nanotechnology, 2010 - ieeexplore.ieee.org
Addition is the most widely used arithmetic operation in digital applications. The reliability of
full adder (FA) cells is crucial as they affect arithmetic logic and floating-point units, as well …

On practical multiplexing issues

V Beiu, MH Sulieman - 2006 Sixth IEEE Conference on …, 2006 - ieeexplore.ieee.org
This paper investigates the behavior of multiplexing schemes in combination with
elementary gates. The two schemes under investigation are MAJORITY-and NAND …

Recursive approach to the design of a parallel self-timed adder

MZ Rahman, L Kleeman… - IEEE transactions on very …, 2014 - ieeexplore.ieee.org
This brief presents a parallel single-rail self-timed adder. It is based on a recursive
formulation for performing multibit binary addition. The operation is parallel for those bits that …