The rapid development of CMOS and non-CMOS nanotechnologies has opened up new
possibilities and introduced new challenges for circuit design. One of the main challenges is …

Reliability is becoming one of increasingly critical issues for design of modern integrated
circuits, due to the continuous scaling of CMOS technology and emerging nano-scale …

Circuit reliability has become a growing concern in today's nanoelectronics, which motivates
strong research interest over the years in reliability analysis and reliability‐oriented circuit …

Logic circuits built using nanoscale technologies have significant reliability limitations due to
fundamental physical and manufacturing constraints of their constituent devices. This paper …

Probabilistic reliability analysis is a common approach in logic circuit reliability analysis.
Existing methods suffer from accuracy or scalability problems for large circuits because of …

In nanometric integrated circuits, reliability has become one of the main design measures.
This makes the reliability evaluation process an inevitable part in the circuit design flow. In …

Reliability of logic circuits is emerging as an important concern in scaled electronic
technologies. Reliability analysis of logic circuits is computationally complex because of the …

Reliability has become one of the major goals for designs based on emerging technologies.
Therefore, reliability evaluation should be included in the design flow of logic integrated …

Reliability is fast becoming a major concern due to the nanometric scaling of CMOS
technology. Accurate analytical approaches for the reliability evaluation of logic circuits …

As the sizes of CMOS devices rapidly scale deep into the nanometer range, the manufacture
of nanocircuits will become extremely complex and will inevitably introduce more defects …