Qualification process for cryo-electron microscopy samples as well as related sample holder
A Eckhardt, A Meyer, K Dierks - US Patent 11,609,171, 2023 - Google Patents
(57) ABSTRACT A qualification process for a sample to be examined by means of cryo-
electron microscopy. The, sample (12) is applied to a sample carrier (10) provided for cryo …
electron microscopy. The, sample (12) is applied to a sample carrier (10) provided for cryo …