An overview on analyses and suppression methods of trapping effects in AlGaN/GaN HEMTs

R Ye, X Cai, C Du, H Liu, Y Zhang, X Duan… - IEEE Access, 2021 - ieeexplore.ieee.org
Due to the excellent material characteristics, AlGaN/GaN HEMTs are widely used in high
power and high frequency applications. However, the existence of damages, defects and …

A comprehensive review of AlGaN/GaNHigh electron mobility transistors: Architectures and field plate techniques for high power/high frequency applications

JSR Kumar, HV Du John, IV BinolaKJebalin… - Microelectronics …, 2023 - Elsevier
Abstract AlGaN/GaN High Electron Mobility Transistor (HEMT) frequently employs field plate
techniques to improve the device's reliability and optimum performance. This literature …

Slanted tri-gates for high-voltage GaN power devices

J Ma, E Matioli - IEEE Electron Device Letters, 2017 - ieeexplore.ieee.org
In this letter, we introduce and demonstrate the concept of slanted tri-gates to enhance the
breakdown voltage (V BR) in lateral GaN power devices. Conventionally, field plates (FPs) …

Deeply-scaled GaN-on-Si high electron mobility transistors with record cut-off frequency fT of 310 GHz

H Xie, Z Liu, Y Gao, K Ranjan, KE Lee… - Applied Physics …, 2019 - iopscience.iop.org
A deeply-scaled GaN-on-Si high electron mobility transistor with a record-high cut-off
frequency (f T) of 310áGHz has been demonstrated. The device has an InAlN/GaN …

CMOS-compatible GaN-on-Si HEMTs with cut-off frequency of 210 GHz and high Johnson's figure-of-merit of 8.8 THz V

H Xie, Z Liu, Y Gao, K Ranjan, KE Lee… - Applied Physics …, 2020 - iopscience.iop.org
GaN-on-Si high electron mobility transistors (HEMTs) with 80ánm gate length fabricated
using Si CMOS-compatible Ta/Al ohmic and Ti/Al gate contacts are reported in this work …

A review on GaN HEMTs: nonlinear mechanisms and improvement methods

C Du, R Ye, X Cai, X Duan, H Liu… - Journal of …, 2023 - iopscience.iop.org
The GaN HEMT is a potential candidate for RF applications due to the high frequency and
large power handling capability. To ensure the quality of the communication signal, linearity …

Neutral beam process in AlGaN/GaN HEMTs: Impact on current collapse

F Hemmi, C Thomas, YC Lai, A Higo, Y Watamura… - Solid-State …, 2017 - Elsevier
In this paper, we report a promising approach for the gate recess process with a suppressed
current collapse in GaN-based high electron mobility transistors (HEMTs) by means of …

Transient response of drain current following biasing stress in GaN HEMTs on SiC substrates with a field plate

Q Ma, T Yoshida, Y Ando… - Japanese Journal of …, 2020 - iopscience.iop.org
This paper investigates the current collapse and transient response of a drain current (I d)
following the transition to an off-state in GaN high-electron-mobility transistors (HEMTs) on …

Neutral beam etching for device isolation in AlGaN/GaN HEMTs

F Hemmi, C Thomas, YC Lai, A Higo… - … status solidi (a), 2017 - Wiley Online Library
In this article, we report a suppression of leakage current and an improvement of isolation
breakdown voltage on GaN‐based high electron mobility transistors (HEMTs) by means of …

[PDF][PDF] Reduction of reverse leakage current at the TiO 2/GaN interface in field plate Ni/Au/n-GaN Schottky diodes

BN Shashikala… - … Phys., Quantum Electron …, 2021 - journal-spqeo.org.ua
This paper presents the fabrication procedure of TiO2 passivated field plate Schottky diode
and gives a comparison of Ni/Au/n-GaN Schottky barrier diodes without field plate and with …