Methods for forming silicon-containing epitaxial layers and related semiconductor device structures
N Bhargava, J Tolle, J Margetis, M Goodman… - US Patent …, 2019 - Google Patents
A method for forming a silicon-containing epitaxial layer is disclosed. The method may
include, heating a substrate to a temperature of less than approximately 950 C. and …
include, heating a substrate to a temperature of less than approximately 950 C. and …
Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
TJV Blanquart, M Utsuno, S Yoshio… - US Patent …, 2020 - Google Patents
A film having filling capability is deposited by forming a viscous polymer in a gas phase by
striking an Ar, He, or N2 plasma in a chamber filled with a volatile hydrocarbon precursor …
striking an Ar, He, or N2 plasma in a chamber filled with a volatile hydrocarbon precursor …
Temperature-controlled flange and reactor system including same
(57) ABSTRACT A flange, flange assembly, and reactor system including the flange and
flange assembly are disclosed. An exemplary flange assembly includes heated and cooled …
flange assembly are disclosed. An exemplary flange assembly includes heated and cooled …
Methods for forming a silicon nitride film on a substrate and related semiconductor device structures
JH Woodruff, B Sharma, EJ Shero - US Patent 10,892,156, 2021 - Google Patents
A method for forming a silicon nitride film on a substrate is disclosed. The method may
include; forming a cyclical silicon nitride film on the substrate by a cyclical deposition …
include; forming a cyclical silicon nitride film on the substrate by a cyclical deposition …
Substrate rack and a substrate processing system and method
D Pierreux, W Knaepen, B Jongbloed… - US Patent …, 2021 - Google Patents
The invention relates to a substrate rack and a substrate processing system for processing
substrates in a reaction chamber. The substrate rack may be used for introducing a plurality …
substrates in a reaction chamber. The substrate rack may be used for introducing a plurality …
Thin-film deposition method and manufacturing method of semiconductor device
MS Lee, SK Kang, E Lee, M Kim, S Choi - US Patent 10,914,004, 2021 - Google Patents
(57) ABSTRACT A method of depositing a thin film having a desired etching characteristic
while improving a loss amount and loss uni formity of a lower film includes, on the …
while improving a loss amount and loss uni formity of a lower film includes, on the …
Semiconductor processing reactor and components thereof
EJ Shero, ME Verghese, CL White, H Terhorst… - US Patent …, 2020 - Google Patents
A reactor having a housing that encloses a gas delivery system operatively connected to a
reaction chamber and an exhaust assembly. The gas delivery system includes a plurality of …
reaction chamber and an exhaust assembly. The gas delivery system includes a plurality of …
Method for forming an ultraviolet radiation responsive metal oxide-containing film
H Huotari, JW Maes - US Patent 11,217,444, 2022 - Google Patents
H01L21/02112—Forming insulating materials on a substrate characterised by the type of
layer, eg type of material, porous/non-porous, pre-cursors, mixtures or laminates …
layer, eg type of material, porous/non-porous, pre-cursors, mixtures or laminates …
Method of forming a germanium oxynitride film
F Tang, Q Xie, JW Maes, X Jiang… - US Patent 11,101,370, 2021 - Google Patents
A method for forming layers suitable for a V-NAND stack is disclosed. Specifically, the
method may include multiple cycles for forming an oxide and a nitride in order to form an …
method may include multiple cycles for forming an oxide and a nitride in order to form an …
Thin film deposition method
KC Um, JH Han, DH Kim, Y Han, TH Yoo… - US Patent …, 2022 - Google Patents
2020-01-26 Assigned to ASM IP HOLDING BV reassignment ASM IP HOLDING BV
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors …
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors …