Modern reliability engineering accelerated life tests (ALT) and partially accelerated life tests
(PALT) are widely used to obtain the timely information on the reliability of objects, products …

Partial accelerated life tests (PALTs) are employed when the results of accelerated life
testing cannot be extended to usage circumstances. This work discusses the challenge of …

The issue of various estimation techniques in constant partially accelerated life tests with
complete data is the main subject of this research. The Chen distribution is regarded as an …

In this paper, under the symmetric entropy and the scale squared error loss functions, we
consider the maximum likelihood (ML) estimation and Bayesian estimation of the Shannon …

This paper deals with the classical and Bayesian estimations of step-stress partially
accelerated life test model under type-I censoring for the inverse Weibull lifetime distribution …

Accelerated life tests (ALTs) of highly reliable products or materials are effective testing
techniques to gather failure data rapidly in a limited time period. Also, partially accelerated …

在恒定应力部分加速寿命试验下, 基于左删失样本, 研究了逆Rayleigh 分布的参数估计问题.
运用极大似然法得到未知参数和加速因子的极大似然估计. 根据Louis 提出的缺失信息原则 …

In this paper, optimum test plans of step-stress partially accelerated life tests are developed
using failure-censored data from Burr type-XII distribution. The maximum likelihood …

If the objects have high reliability, then checking the life span of components in regular use
circumstances takes extra time and expenditure compared to accelerated circumstances …

This paper presents the optimal design of constant-stress partially accelerated life tests
(CSPALT) using type-II censored data from the inverse Weibull distribution. The maximum …