With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-
the-field faults. To be broadly deployable, the hardware reliability solution must incur low …

Variations in process parameters affect the operation of integrated circuits (ICs) and pose a
significant threat to the continued scaling of transistor dimensions. Such parameter …

Increased power densities (and resultant temperatures) and other effects of device scaling
are predicted to cause significant lifetime reliability problems in the near future. In this paper …

High availability is an increasingly important requirement for enterprise systems, often
valued more than performance. Systems designed for high availability typically use …

As silicon technologies move into the nanometer regime, transistor reliability is expected to
wane as devices become subject to extreme process variation, particle-induced transient …

Future many-core microprocessors are likely to be heterogeneous, by design or due to
variability and defects. The latter type of heterogeneity is especially challenging due to its …

This paper reports the results of a study investigating the role of Web portals in state
government electronic service delivery. We describe the functionality of the fifty US state …

The huge investment in the design and production of multicore processors may be put at risk
because the emerging highly miniaturized but unreliable fabrication technologies will …

Future microprocessors may become so power constrained that not all transistors will be
able to be powered on at once. These systems will be required to nimbly adapt to changes …

The incidence of hard errors in CPUs is a challenge for future multicore designs due to
increasing total core area. Even if the location and nature of hard errors are known a priori …