Polarization contrast linear spectroscopies for cubic semiconductors under stress: macro‐and micro‐reflectance difference spectroscopies
LF Lastras‐Martínez, RE Balderas‐Navarro… - Annalen der …, 2011 - Wiley Online Library
The technique to measure optical anisotropies (OA) in cubic semiconductors is termed either
reflectance difference spectroscopy (RDS) or reflectance anisotropy spectroscopy (RAS). In …
reflectance difference spectroscopy (RDS) or reflectance anisotropy spectroscopy (RAS). In …
Theoretical study on photon–phonon coupling at (001)‐(2 × 1) surfaces of Ge and α‐Sn
FL Pérez‐Sánchez… - physica status solidi (b …, 2011 - Wiley Online Library
We present a study of the far‐infrared reflectance anisotropy spectra for (001) surfaces of Ge
and α‐Sn in the (2× 1) asymmetric dimer geometry, which exhibit a resonance structure …
and α‐Sn in the (2× 1) asymmetric dimer geometry, which exhibit a resonance structure …
[引用][C] Espectroscopías de contraste en polarización lineal para heteroestructuras semiconductoras: macro y micro reflectancia diferencial
MCRH Jasso - 2015 - Universidad Autónoma de San Luis …