Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

The study of oxygen-uranium reactions at 200 GeV/nucleon shows a significant transverse
energy dependence of the yield of J Ψ's relative to muon pairs produced in the mass …

This paper proposes a new self-healing methodology for embedded RF amplifiers in RF sub-
systems. The proposed methodology is based on oscillation principles in which the device …

In open software development environment, a large number of feature requests with mixed
quality are often posted by stakeholders and usually managed in issue tracking systems …

This paper aims to develop an approach to test analog and mixed-signal embedded-core-
based system-on-chips (SOCs) with built-in hardware. In particular, oscillation-based built-in …

Due to the lack of widely applicable fault models, testing for analog, mixedsignal (AMS), and
radio frequency (RF) circuits has been, and will continue to be, primarily based on checking …

Driven by the need of reducing the defective circuits to a minimum, present-day fabrication
technologies require design techniques been complemented by effective test procedures. In …

The paper proposes a BIST approach for deriving the main characterization parameters of
ADCs from histogram data. An adequate choice of input stimuli and time decomposition …

A general BIST architecture for A-to-D converters involves the integration of both an analog
test signal generator and a digital output response analyzer. This paper presents a structure …

We propose a new structural testing of phase-locked loops (PLLs) using charge-based
frequency measurement BIST (CF-BIST) technique. The technique uses the existing charge …