Analysis of electron emission from a single silicon cathode to quasi-vacuum (air) using atomic force microscopy

SV Mit'ko, PY Glagolev - Technical Physics, 2020 - Springer
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …
被引用次数：3 相关文章

[引用][C] Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

ID Evsikov, SV Mit'ko, PY Glagolev, NA Djuzhev… - Technical Physics, 2020 - elibrary.ru
[PDF] ckp-miet.ru

[PDF][PDF] Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

ID Evsikova, SV Mit'koa, PY Glagoleva… - TECHNICAL …, 2020 - ckp-miet.ru
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy.

ID Evsikov, SV Mit'ko, PY Glagolev… - Technical …, 2020 - search.ebscohost.com
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

ID Evsikov, SV Mit'ko, PY Glagolev, NA Djuzhev… - Technical …, 2020 - go.gale.com
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …

Analysis of electron emission from a single silicon cathode to quasi-vacuum (air) using atomic force microscopy

ID Evsikov, SV Mitko, PY Glagolev… - Zhurnal Tekhnicheskoi …, 2020 - mathnet.ru
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …

Analysis of Electron Emission from a Single Silicon Cathode to Quasi-Vacuum (Air) Using Atomic Force Microscopy

ID Evsikov, SV Mit'ko, PY Glagolev… - Journal of Technical …, 2020 - ui.adsabs.harvard.edu
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …

Analysis of electron emission from a single silicon cathode to quasi-vacuum (air) using atomic force microscopy

ID Evsikov, SV Mitko, PY Glagolev… - Zhurnal Tekhnicheskoi …, 2020 - mathnet.ru
Atomic force microscopy is employed in the experimental study of specific features of the
field emission of electrons from a single silicon needle-type cathode to quasi-vacuum (air) …