Active Atomic Force Microscope (AFM) cantilevers with integrated actuator/sensor pairs
display larger feedthrough than conventional base excited cantilevers operating in …

Microcantilevers featuring separate built-in actuation and displacement sensing capabilities
allow effective and simple implementation of control methods, opening a pathway to …

This manuscript presents a novel microcantilever with an embedded piezoelectric sensor-
actuator pair for dynamic atomic force microscopy (AFM). The transducer pair is constructed …

Active microcantilevers with on-chip sensing and actuation provide significant advantages in
tapping mode Atomic Force Microscopy (AFM). Collocated transduction allows for effective …

As progress in molecular biology and nanotechnology continues, demand for rapid and high
quality image acquisition has increased to the point where the limitations of atomic force …

One of the major prerequisites to obtaining highspeed tapping-mode atomic force
microscopy (AFM) is a controllable quality (Q) factor. This can be achieved through the use …

We present a novel approach to fundamentally eliminate electrical feedthrough (cross-talk)
signal in self-sensing piezoelectric microcantilevers, used in dynamic mode atomic force …

Atomic force microscopy typically relies on high-resolution high-bandwidth cantilever
deflection measurements based control for imaging and estimating sample topography and …

Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from
spurious mechanical resonances in the loop between the signal driving the cantilever and …

Atomic force microscope (AFM) cantilevers with integrated actuation and sensing provide
several distinct advantages over conventional cantilever instrumentation. These include …