A scanning force microscope and environmental chamber are described for use in studying
the surface properties of ice that is grown from vapor. This microscope uses a modulated …

The interaction between oxidized silicon atomic force microscope tips and vapor-deposited
ice in a pure water vapor environment is studied using force curve measurements. The …

The atomic force microscope was used to investigate surface properties of ice in a
temperature range of− 24 to− 0.7° C. An upper limit of the thickness of the liquidlike layer on …

To investigate the surface morphologies of biological systems in a controlled gaseous
environment (eg, the temperature, humidity and composition), most commercial atomic force …

The friction of nanometer thin ice films grown on mica substrates is investigated using atomic
force microscopy (AFM). Friction was found to be of similar magnitude as the static friction of …

We present the design of a scanning force microscope and vacuum chamber for the growth
and imaging of ice films in thermodynamic equilibrium and under controlled super or …

Contact mode of scanning force microscopy (SFM) and force curves (FC) were used to study
the morphology of ice surface in air and in liquid decane and the structure and some …

In force measurements with the atomic force microscope AFM often nonelastic deformations
of the sample are observed. This is especially the case for AFM experiments on ice. In this …

The presence of a liquid-like layer LLL on the ice surface and its characteristics have been
investigated for many decades. Diverse techniques have been employed to study this …

We have indented the surface of ice at temperatures between-1 C and-17 C with sharp
atomic force microscope tips. For a thick viscous interfacial melt layer, a Newtonian …