Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, three related recombinant inbred line …

Flag leaf-related traits (FLRTs) are determinant traits affecting plant architecture and yield
potential in wheat (Triticum aestivum L.). In this study, a recombinant inbred line population …

Flag leaf size is a crucial trait influencing plant architecture and yield potential in wheat. A
recombinant inbred line (RIL) population derived from the cross of W7268 and Chuanyu 12 …

Leaf size is an important factor contributing to the photosynthetic capability of wheat plants. It
also significantly affects various agronomic traits. In particular, the flag leaves contribute …

Key message QTL controlling flag leaf length, flag leaf width, flag leaf area and flag leaf
angle were mapped in wheat. Abstract This study aimed to advance our understanding of …

Flag leaves, plant height (PH), and spike-related traits are key determinants contributing to
yield potential in wheat. In this study, we developed a recombinant inbred line (RIL) …

Key message Eight major and stably expressed QTL for flag leaf morphology across eleven
environments were identified and validated using newly developed KASP markers in seven …

Key message Major and environmentally stable QTL for flag leaf-related traits in wheat were
identified and validated across ten environments using six populations with different genetic …

The flag leaf is an important photosynthetic organ of wheat (Triticum aestivum L.).
Appropriate flag leaf size can effectively increase grain yield. In this study, a tetraploid wheat …

Key message The genetic architecture of five flag leaf morphology traits was dissected by
the functional haplotype-based GWAS and a standard SNP-based GWAS in a diverse …