Optical imaging and characterization of graphene and other 2D materials using quantitative phase microscopy
This article introduces an optical microscopy technique for the characterization of two-
dimensional (2D) materials. The technique is based on the use of quadriwave lateral …
dimensional (2D) materials. The technique is based on the use of quadriwave lateral …
Quantitative phase microscopy using quadriwave lateral shearing interferometry (QLSI): principle, terminology, algorithm and grating shadow description
G Baffou - Journal of Physics D: Applied Physics, 2021 - iopscience.iop.org
Quadriwave lateral shearing interferometry (QLSI) is a quantitative phase imaging technique
based on the use of a diffraction grating placed in front of a camera. This grating creates a …
based on the use of a diffraction grating placed in front of a camera. This grating creates a …
Synthetic optical holography for rapid nanoimaging
Holography has paved the way for phase imaging in a variety of wide-field techniques,
including electron, X-ray and optical microscopy. In scanning optical microscopy, however …
including electron, X-ray and optical microscopy. In scanning optical microscopy, however …
Wavefront microscopy using quadriwave lateral shearing interferometry: From bioimaging to nanophotonics
G Baffou - ACS photonics, 2023 - ACS Publications
Common cameras are only sensitive to the intensity of light, discarding an essential feature
of a light wave: its phase profile or, equivalently, its wavefront profile. This Review focuses …
of a light wave: its phase profile or, equivalently, its wavefront profile. This Review focuses …
Rapid, substrate-independent thickness determination of large area graphene layers
DK Venkatachalam, P Parkinson, S Ruffell… - Applied Physics …, 2011 - pubs.aip.org
Phase-shifting interferometric imaging is shown to be a powerful analytical tool for studying
graphene films, providing quantitative analysis of large area samples with an optical …
graphene films, providing quantitative analysis of large area samples with an optical …
A review of optics-based methods for thickness and surface characterization of two-dimensional materials
Abstract Two-dimensional (2D) materials have attracted great attention because of their
unique physical properties and versatile applications in electronics and photonics. Following …
unique physical properties and versatile applications in electronics and photonics. Following …
Topography and refractometry of nanostructures using spatial light interference microscopy
Spatial light interference microscopy (SLIM) is a novel method developed in our laboratory
that provides quantitative phase images of transparent structures with a 0.3 nm spatial and …
that provides quantitative phase images of transparent structures with a 0.3 nm spatial and …
Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond
Optical inspection is a rapid and non‐destructive method for characterizing the properties of
two‐dimensional (2D) materials. With the aid of optical inspection, in situ and scalable …
two‐dimensional (2D) materials. With the aid of optical inspection, in situ and scalable …
Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging
We demonstrate an optical technique for large field of view quantitative phase imaging of
reflective samples. It relies on a common-path interferometric design, which ensures high …
reflective samples. It relies on a common-path interferometric design, which ensures high …
Quantitative phase and refractive index imaging of 3D objects via optical transfer function reshaping
H Hugonnet, MJ Lee, YK Park - Optics Express, 2022 - opg.optica.org
Deconvolution phase microscopy enables high-contrast visualization of transparent samples
through reconstructions of their transmitted phases or refractive indexes. Herein, we propose …
through reconstructions of their transmitted phases or refractive indexes. Herein, we propose …