This paper describes a new built-in self test (BIST) technique suitable for both functional and
structural testing of analog and mixed-signal circuits based on the oscillation-test …

This paper describes a practical test approach for analog-to-digital converters (ADCs) based
on the oscillation-test strategy. The oscillation-test is applied to convert the ADC under test to …

A new low-cost test method for analog integrated circuits, called oscillation-test, is
presented. During the test mode, the circuit under test (CUT) is converted to a circuit that …

Built-in-self-test (BIST) for VLSI systems is desirable for production-time testing and in the
field diagnostics. This paper discusses a Mixed Analog Digital BIST (MADBIST) for a …

Built-In-Self-Test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of
production-time testing by the manufacturer. In addition, it can provide the means to perform …

A (partial) Built-in Self-Test (BIST) methodology is proposed for analog to digital (A/D)
converters. In this methodology the number of bits of the A/D converter that needs to be …

This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC)
based on a linear ramp generator and efficient output analysis. The proposed analysis …

This paper investigates parametric and catastrophic fault coverage of the oscillation-test
strategy. A set of definitions to evaluate the efficiency of a test technique and to quantify the …

In this paper, a new built-in self-test structure to test the static specifications of analog to
digital converters (ADCs) is presented. A ramp signal generated by an integrator serves as a …

A low-cost and comprehensive built-in self-test (BIST) methodology for analog and mixed-
signal circuits is described. We implement a time-division multiplexing (TDM) comparator to …