Low dielectric constant materials for microelectronics

K Maex, MR Baklanov, D Shamiryan, F Lacopi… - Journal of Applied …, 2003 - pubs.aip.org
The ever increasing requirements for electrical performance of on-chip wiring has driven
three major technological advances in recent years. First, copper has replaced Aluminum as …

Low dielectric constant materials for ULSI interconnects

M Morgen, ET Ryan, JH Zhao, C Hu… - Annual Review of …, 2000 - annualreviews.org
▪ Abstract As integrated circuit (IC) dimensions continue to decrease, RC delay, crosstalk
noise, and power dissipation of the interconnect structure become limiting factors for ultra …

Overview on low dielectric constant materials for IC applications

PS Ho, J Leu, WW Lee - Low Dielectric Constant Materials for IC …, 2003 - Springer
As integrated circuit dimensions continue to decrease, RC delay, crosstalk noise and power
dissipation of the interconnect structure become limiting factors for ultra-large-scale …

Porous low dielectric constant materials for microelectronics

MR Baklanov, K Maex - Philosophical Transactions of the …, 2006 - royalsocietypublishing.org
Materials with a low dielectric constant are required as interlayer dielectrics for the on-chip
interconnection of ultra-large-scale integration devices to provide high speed, low dynamic …

Research progress on porous low dielectric constant materials

M Xie, M Li, Q Sun, W Fan, S Xia, W Fu - Materials Science in …, 2022 - Elsevier
With the rapid development of ultra-large-scale integration (ULSI) of integrated circuits, the
feature size of the silicon chip continues shrinking and the physical gate length is …

Porosity in plasma enhanced chemical vapor deposited SiCOH dielectrics: A comparative study

A Grill, V Patel, KP Rodbell, E Huang… - Journal of Applied …, 2003 - pubs.aip.org
The advancement in the performance of ultralarge scale integrated ULSI circuits is still being
hindered by the delay in the introduction of insulators of significantly reduced dielectric …

Challenges in the implementation of low-k dielectrics in the back-end of line

R Hoofman, G Verheijden, J Michelon, F Iacopi… - Microelectronic …, 2005 - Elsevier
The introduction of ultra low-k materials in copper technology has been much slower than
anticipated in the ITRS Roadmap. The introduction of porosity in low-k materials has …

High and low dielectric constant materials

R Singh, RK Ulrich - The Electrochemical Society Interface, 1999 - iopscience.iop.org
26 The Electrochemical Society Interface• Summer 1999 ilicon-based dielectrics (SiO2,
Si3N4, SiOxNy etc.) have been widely used as the key dielectrics in the manufacturing of …

[图书][B] Handbook of low and high dielectric constant materials and their applications, two-volume set

HS Nalwa - 1999 - books.google.com
Recent developments in microelectronics technologies have created a great demand for
interlayer dielectric materials with a very low dielectric constant. They will play a crucial role …

[HTML][HTML] Progress in the development and understanding of advanced low k and ultralow k dielectrics for very large-scale integrated interconnects—State of the art

A Grill, SM Gates, TE Ryan, SV Nguyen… - Applied Physics …, 2014 - pubs.aip.org
The improved performance of the semiconductor microprocessors was achieved for several
decades by continuous scaling of the device dimensions while using the same materials for …