Manipulation of C60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy

F Loske, A Kühnle - Applied Physics Letters, 2009 - pubs.aip.org
Regular, almost quadratic pits were created in an island of C 60 molecules on a rutile TiO 2
(110) surface using noncontact atomic force microscopy at room temperature. Upon …

Growth of ordered C60 islands on TiO2 (110)

F Loske, R Bechstein, J Schütte, F Ostendorf… - …, 2009 - iopscience.iop.org
Non-contact atomic force microscopy is used to study C 60 molecules deposited on the rutile
TiO 2 (110) surface in situ at room temperature. At submonolayer coverages, molecules …

Molecular resolution imaging of C60 on Au (111) by non-contact atomic force microscopy

JM Mativetsky, SA Burke, R Hoffmann, Y Sun… - …, 2004 - iopscience.iop.org
Non-contact atomic force microscopy (NC-AFM) was used to study thin films of C 60 on Au
(111). After observing the Au (111) reconstruction, 2–3 monolayers of C 60 were deposited …

Investigations of C60 molecules deposited on Si (111) by noncontact atomic force microscopy

K Kobayashi, H Yamada, T Horiuchi… - Applied surface science, 1999 - Elsevier
We demonstrated the high resolution imaging of the organic molecules using noncontact
atomic force microscopy in ultrahigh vacuum. The sample was C60 molecules deposited on …

Measurement of forces during the modification of C60 islands

MA Lantz, SJ O'Shea, ME Welland - Surface science, 1999 - Elsevier
A UHV atomic force microscope with a conducting tip is used to measure the tip–sample
conductance as a function of the applied force on well-ordered, monolayer islands of C60 on …

Dynamic Force Microscopy Investigations of C60 Deposited on Si (111) Surface

KKK Kobayashi, HYH Yamada… - Japanese Journal of …, 1999 - iopscience.iop.org
Dynamic force microscopy (DFM) was applied for investigating on the structures of C 60
multilayer thin films deposited on the Si (111)-7× 7 reconstructed surface. C 60 molecules on …

Contrast inversion in non-contact atomic force microscopy imaging of C60 molecules

F Loske, P Rahe, A Kühnle - Nanotechnology, 2009 - iopscience.iop.org
Non-contact atomic force microscopy (NC-AFM) was applied to study C 60 molecules on
rutile TiO 2 (110). Depending on the tip–sample distance, distinctly different molecular …

Atomic force microscopy images obtained with C60 modified tips

S Kim, SK Park, C Park, IC Jeon - … of Vacuum Science & Technology B …, 1996 - pubs.aip.org
We prepared thioacetate derivatives of C60 for studying tip–substrate interactions in force
microscopy. They are expected to make ideal hydrophobic surfaces over tips that are …

Nanoscale manipulation of C60 with a scanning tunneling microscope

S Maruno, K Inanaga, T Isu - Microelectronic engineering, 1995 - Elsevier
Scanning tunneling microscope has been employed for nanoscale manipulation of C60
molecules on Si (111) clean surfaces at room temperature. It was demonstrated that C60 …

The manipulation of C60 in molecular arrays with an STM tip in regimes below the decomposition threshold

DA Olyanich, VG Kotlyar, TV Utas, AV Zotov… - …, 2013 - iopscience.iop.org
The ability of scanning tunneling microscopy to manipulate selected C 60 molecules within
close packed C 60 arrays on a (Au, In)/Si (111) surface has been examined for mild …